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ESD Testing Serviceの製品一覧

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ESD (HBM・MM) Testing Contract Service

ESD (HBM・MM) Testing Contract Service

We provide testing services to evaluate the resistance to ESD (electrostatic discharge), which is important for the reliability of semiconductor products and electronic components that contain them.

■ We support products such as IC modules, electronic components, and subsystems with up to 512 pins. ■ We provide testing that complies with major domestic and international standards such as ESDA/JEDEC, JEITA, AEC, and IEC. ■ We propose and conduct tests tailored to our customers' requests and objectives. ■ In the event of any issues with reliability, we assist with failure analysis and problem resolution.

  • Other analytical equipment

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無料会員登録
ESD (CDM) testing outsourcing service

ESD (CDM) testing outsourcing service

We provide testing services to evaluate the resistance of the Charged Device Model (CDM) to ESD.

■ We will support each specification waveform for JEDEC, JEITA (EIAJ), and AEC through unit replacement. ■ We support both Direct Charge Method (Direct CDM) and Field Induced Method (Field Induced CDM). ■ The contact state confirmation function of the applied pins ensures reliable application. ■ Destruction judgment support is also possible using diode characteristic judgment methods (consultation required).

  • Other analytical equipment
  • Analysis and prediction system

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無料会員登録
ESD (CDM) Testing Contract Service

ESD (CDM) Testing Contract Service

Reliable application through the contact confirmation function of the applied pin! Compatible with direct charging method and electric field induction method.

The "ESD (CDM) Testing Contract Service" evaluates the resistance of semiconductor products and electronic components, which are crucial for reliability, to damage caused by ESD in device charging models. It supports both Direct Charge Method (Direct CDM) and Field Induced Method (Field Induced CDM). Additionally, it is possible to determine damage through diode characteristic evaluation methods and other characteristic assessments (using separate equipment). 【Features】 ■ Compatible with various standard conditions such as JEDEC, JEITA (EIAJ also acceptable), and AEC through unit replacement. ■ Supports both Direct Charge Method (Direct CDM) and Field Induced Method (Field Induced CDM). ■ Also complies with AEC-Q100-011 for Direct Charge Method and Field Induced Method. ■ Damage determination is also possible through diode characteristic evaluation methods and other characteristic assessments. ■ Ensures reliable application through contact confirmation functions for applied pins. *For more details, please refer to the PDF materials or feel free to contact us.

  • Other analytical equipment

ブックマークに追加いたしました

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ブックマークを削除いたしました

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これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録
ESD (HBM・MM) Test Contract Service

ESD (HBM・MM) Test Contract Service

From DUT board production to testing! We will propose and conduct tests according to your requests and objectives.

The "ESD (HBM・MM) Testing Service" evaluates the resistance to damage caused by ESD (Electrostatic Discharge) using the Human Body Model and Machine Model, which are important for the reliability of semiconductor products and electronic components that include them. We support products such as IC modules, semiconductor products, and subsystems with up to 512 pins. We conduct tests in accordance with major domestic and international standards such as ESDA/JEDEC, JEITA, AEC, and IEC. Additionally, if there are issues with resistance, we assist in problem-solving, including failure analysis and root cause investigation. 【Features】 ■ Supports products such as IC modules, semiconductor products, and subsystems with up to 512 pins ■ Partial support for products with more than 512 pins (consultation required) ■ Conducts tests in accordance with major domestic and international standards such as ESDA/JEDEC, JEITA, AEC, and IEC ■ Proposes and conducts tests based on customer requests and objectives ■ Assists in problem-solving, including failure analysis and root cause investigation, if there are issues with resistance *For more details, please refer to the PDF materials or feel free to contact us.

  • Analysis and prediction system

ブックマークに追加いたしました

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ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録
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